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Particle Identification
Particle Identification
Rely on the team at Micro Measurement Labs to identify unknown contaminant particles in your facility or process. We provide particle isolation and identification services by optical microscopy, Fourier-Transform/Infra-Red (FT-IR), or Raman spectroscopy.
Problem Solving through Contaminant Identification
At Micro Measurement Labs, our expertise spans multiple industries, including pharmaceuticals, automotive, semiconductors, aerospace, and general parts cleaning. By pinpointing the exact nature of the contaminant, we help you uncover the root cause of the issue, leading to faster remediation and reduced downtime. Trust our team to provide the insights you need for effective problem-solving and operational efficiency. Our comprehensive services include:
Particle Isolation
Our particle isolation process employs precise techniques to ensure accurate sample preparation for subsequent analysis. Utilizing high-efficiency filtration systems, particles are separated from the bulk material and collected onto appropriate filtration membranes.
For samples requiring targeted extraction, fine instruments under a microscope are used to meticulously isolate individual particles.
Optical Microscopy
Our optical microscopy services employ advanced imaging and documentation techniques to provide detailed analysis of particle microstructure. A combination of optical filters, lenses, fine-tuned illumination systems, a broad range of magnification options, and high-resolution cameras are used to capture detailed micrographs to help characterize the sample based on its morphology.
SEM & EDS
Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDS) are complementary techniques used for detailed material characterization. SEM provides structural analysis via electron imaging and EDS provides elemental analysis through x-ray spectroscopy. These techniques can be used on samples as small as 25 µm and are particularly effective for characterizing metals, minerals, metal salts of organic compounds, and metal containing organic compounds.
FT-IR Microspectrosopy
Fourier-Transform Infrared (FT-IR) spectroscopy is an analytical technique utilized to characterize a sample based on its absorptive properties. By measuring how a sample absorbs infrared light at different wavelengths, FT-IR provides a unique spectral fingerprint that can be used to identify particulate matter, particularly organic substances. At MML, our diamond ATR attachment may be utilized for macroscopic samples, while the microscope attachment is available for microscopic particles as small as 25 µm.
